In planning microsystems one always has to deal with signals from sensors. In order to optimize the signal path through the system, signal caracteristics delivered by the sensor has to be evaluated.

• Does the sensor have a voltage or a current output?
• What is the impedance of the sensor output?
• What is the transfer characteristics of the sensor? (linear?)
• What is the noise level of the sensor ? (limiting resolution)
• Is there a lot of power necessary in order to operate the sensor?
• Is there an optimum operating point?   

A lot of questions to answer in order to get a working microsystem!

To answer these questions we must do some characterization of sensors, especially of those sensors we want to use.

We are well equipped and experienced in doing the following measurements:

• Electrical DC and AC measurements
  Sources:
  • Voltage: up to 200 V (HP4142) or
    down to a resoluton of 5 uV (Keithley 2010)
  • Current: up to 5 A (HP6624A) or
    down to a resolution of 20 fA (HP4142)
  • Frequencies: up to 50 MHz (HP8165A) or
    down to a resolution of 1 mHz
       
  Measurements: 
• • Voltage: up to 1000 V (Keithley 2010) or
    down to a resoluton of 10 nV (Keithley 2010)
  • Current: up to 5 A (HP6624A) or
    down to a resolution of 20 fA (HP4142)
    
    
• Magnetic transfer characteristic (-10 mT to +10 mT)
  calibrated with Lake Shore Model 450
  
• Temperature characteristic  (-25°C to 150°C) 
• • High resolution (TP 315B Termochuck)
  • Wide range (Weiss Klimakammer
       
• Force and torque measurements (maximum 10 N or 1 Nm)
  
• Noise measurements
  • Spectral (HP3589A Spectrum/Network Analyzer)
  • Time domain (HP54601A/HP54645D Digital Scope)   

So we are able to characterize

• magnetic field sensors
  
• current sensors
  
• temperature sensors
  
• force sensors
  
• photo sensors   

All the equipment listed above is fully integrated in our measurement system. Thus we can do automated measurements concerning all aspects mentioned above.