Service

Fraunhofer Institute for Integrated Circuits

X-ray Diffraction

Röntgenbeugung

In cooperation with the chair of crystallography and structural physics of the Friedrich-Alexander-Universität Erlangen-Nürnberg.




The X-ray diffraction technology is applied for the inspection of crystalline materials:

  • Structural analysis of polycrystalline materials and semi-crystalline specimens
  • Characterization of the quality of natural and artificial crystals

Topics

Qualitative and quantitative phase analysis, defects, stresses and textures. In-situ inspections for the optimization of crystal processing.

Questions of research

In addition to a large scale of classical X-ray diffractometers, a newly developed high energy system provides for the analysis of compact specimens of a thickness of up to several centimetres and allows inspections in a complex specimen environment.