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VERSION:2.0
PRODID:-//Fraunhofer-Gesellschaft//Fraunhofer Institute for Integrated Circ
 uits IIS//ENGLISH
BEGIN:VEVENT
UID:66f5f2f8-04a0-4cfe-931d-f648edb632d8
DTSTAMP:20260905T020831Z
SUMMARY:Course »Introduction to Evaluation and Test of Integrated Circuits«
DTSTART:20260928T080000Z
DTEND:20260929T150000Z
END:VEVENT
END:VCALENDAR