IC Test Services and Semiconductor Test Solutions

IC test solutions regardless of the number of units

The transition from development to series production is one of the most critical steps in the life cycle of integrated circuits: It determines quality, costs and time-to-market. This phase represents a major hurdle, especially for start-ups, research institutes and smaller design houses without their own test infrastructure. While established test houses are primarily designed for high-volume production, they often lack flexible, cost-efficient test solutions for prototypes and pilot series.

This is exactly where we come in: With our independent IC test services, we close the gap between development and production with scalable, customizable test solutions - from initial evaluation to series production and regardless of the number of units. By using modern ATE systems, individually adapted test programs and flexible hardware solutions, we implement tests that meet both development requirements and series production conditions. This enables us to provide reliable test results and a seamless transfer of your designs to production.

Where IC design meets testing expertise –
test solutions for every development phase

We accompany you from the chip idea to series production with a structured, phase-oriented approach that combines technical excellence and practical implementation. With our team of IC designers and test engineers, we support you in the development and characterization of your integrated circuits and, together with partner test houses, ensure that the transition to series production runs smoothly.

Concept development

 

In the early development phase, we lay the foundations for a successful test strategy:

 

  • Development of test concepts to ensure testability (design-for-test)
  • Creation of specifications for laboratory and production tests

Evaluation

 

During validation and characterization, we put your IC through its paces and provide you with comprehensively characterized samples for system tests:

 

  • Development of PCBs for laboratory and production tests as well as probe cards for wafer testing
  • Development of laboratory test programs with fully automated test setups
  • Commissioning of the device
  • Statistical analysis of measurement results under different environmental influences (temperature, voltage, humidity, etc.)
  • Setting up and carrying out application-specific tests and acceptance tests

Series transfer

 

In the transition to production, we ensure an efficient transfer of the test program:

 

  • Test engineering for production tests on industry-compatible test equipment
  • Test of pilot series
  • Support in the qualification process together with external partners
  • Conversion of test programs between different test platforms

Extended test and characterization services for sensor systems

Sensory characterization

As a specialized service, we carry out the characterization and testing of integrated sensor elements (optical, magnetic, gas-based) at wafer and package level:
 
  • Optoelectronic measurement technology:
    Development and operation of measurement setups, e.g. for spectral characterization
  • Light source control and calibration:
    Use of LEDs, lasers and spectrally defined sources for reproducible tests
  • Magnetic field generation and calibration:
    Setup and control of defined magnetic fields (e.g. 3D Helmholtz coils)
  • Signal and noise characterization:
    Analysis of sensory sensitivity, linearity, hysteresis and noise parameters

High-end measurement technology for electrical and sensory IC tests

Everything you need to test chips


We provide the necessary expertise and infrastructure for reliable electrical and sensor testing of integrated circuits. For precise, reproducible results, we rely on state-of-the-art measuring devices that support both laboratory evaluation and small series testing. This means that ICs and sensor elements can be tested under realistic operating conditions and characterization results can be transferred directly to series production.

Evaluation in the laboratory

  • Modular measurement system for automated laboratory testing
  • Thermostreams for temperature measurements: -60 °C to +225 °C
  • Equipment for in-house 3D printing and wire bonding
  • Table top pick-and-place handler for laboratory characterization: -55 °C to +155 °C

Test engineering and small series testing

  • Two different state-of-the-art Automatic Test Equipment systems (ATE)
  • Wafer prober for fully automated wafer testing: -55 °C to +200 °C, non-magnetic materials close to DuT, optical stimulation possible
  • Pick-and-place handler: -55 °C to +175 °C, non-magnetic materials near DuT, optical stimulation possible

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