Comprehensive Lifetime Prediction for ICs
Fraunhofer IIS/EAS is offering advanced modeling services for device degradation effects in North America. Using these proprietary techniques, designers are now able to verify the long-term behavior of integrated circuits (ICs) and systems especially in safety critical applications. Compared to today’s solutions, the advanced models can be used in all common industrial design environments. In addition to standard degradation effects, Fraunhofer also takes into account more complex dependencies and recovery effects.