Computed laminography (CL) is an ideal X-ray analysis technique for the inspection of laminar components. Due to their unfavorable aspect ratio they are not easily accessible from all sides and thus a regular CT scan cannot be performed. CL is employing alternative scanning geometries for overcoming these hindrances. Individual sectional planes of an object can be represented sharply (focal plane). An extraction of a multitude of focal planes is conducted by means of reconstruction algorithms like tomosynthesis or iterative methods, each having specific advantages. In addition to the inspection of printed circuit boards, CL is applied in the analysis of modern lightweight materials (e.g. fibre reinforced polymers CFRP and GFRP).